This project is the result of collaboration between the Rensselaer Polytechnic Institute (Principal Investigator Professor Michael Shur) and Norwegian University of Science and Technology (Principal Investigator Professor Tor A. Fjeldly). This project is started in 1998. For technical details, please see our related publications.

This remote semiconductor laboratory has two set of experiments on the characterization of diodes, BJTs, and Si MOSFETs that are performed over the Internet. Due to the limitation of the electrical measurement units in our current setup, only one set of experiments is active at one time. Another set of experiments can be switched on when it is needed.

The available experiments are described here:

Experiment Set #1:

Device Parameter Extraction:

Experiment Set #2:

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