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My
primary research areas are in computer vision, pattern recognition, machine
learning, and their applications in medical imaging. I obtained my Ph.D. from
the Department of Electrical, Computer, and Systems Engineering, Rensselaer
Polytechnic Institute, and my B.S. and M.S. in Electrical
Engineering, from the University of
Science and Technology of China.
I am currently a research scientist in Siemens
Corporate Research (SCR), Princeton NJ . Before joining in SCR, I was a post-doctoral research
fellow in the
University of Pennsylvania, Philadelphia PA.
EXPERIENCE
Research
Scientist
2008 ~ Present
Siemens Corporate Research, Princeton
NJ
Post-Doctoral Research
Fellow
2006 ~ 2008
University of Pennsylvania, Philadelphia,
PA
Research Assistant
2003 ~ 2005
Rensselaer Polytechnic Institute
EDUCATION
Ph.D.
Electrical Engineering, Rensselaer Polytechnic
Institute, Troy, NY
M.S. Electrical Engineering,
University of Science and Technology of China, China
B.S. Electrical
Engineering, University of Science and Technology of China, China
RESEARCH INTERESTS
Computer
Vision
Biomedical
Image Analysis
Pattern
Recognition
Machine
Learning
PROFESSIONAL ACTIVITY
PROGRAM COMMITTEE
MEMBER
Workshop
on Motion and Video Computing (WMVC) 2008
Workshop
on Motion and Video Computing (WMVC) 2009
JOURNAL REVIEW
IEEE
Trans. on Pattern Analysis and Machine Intelligence
Pattern
Recognition
Computer
Vision and Image Understanding
Image
and Vision Computing
IEEE Trans. On
System, Man, and Cybernetics, B
Pattern
Recognition Letters
International
Journal of Pattern Recognition and Artificial Intelligence
IEEE
Transaction on Biomedical Engineering,
IEEE
Transaction on Intelligent Transportation Systems
Digital
Signal Processing
IEE
Proceedings of Vision, Images and Signal Processing
International Journal of Computer Applications in
Technology
International
Journal of Image and Graphics
EURASIP
Journal on Image and Video Processing
PROPOSAL REVIEW
U.S.
National Science Foundation (NSF)
Chilean
Research Fund Council (FONDECYT)
PROFESSIONAL AFFILIATION
IEEE Member, IAPR Member, Sigma Xi Member
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