HSCD Test Reticle
Principal Investigator: Prof. John F. McDonald
Center for Integrated Electronics and Electronics Manufacturing
Rensselaer Polytechnic Institute
Rockwell International Corporation
Cadence Design Systems Inc.
First HSCD HBT Reticle
Click on the picture below to see individual chips...
Die Sites Identification Map
This page is still under construction. Send your suggestions to Atul Garg.
(Last updated Mar 27, 1995)